![Defects Spectroscopy in Silicon Diodes: Deep-level traps in semiconductors physics: from ultra-fast recovery to radiation-induced damage: Barbero, Nicolò: 9783639773040: Amazon.com: Books Defects Spectroscopy in Silicon Diodes: Deep-level traps in semiconductors physics: from ultra-fast recovery to radiation-induced damage: Barbero, Nicolò: 9783639773040: Amazon.com: Books](https://m.media-amazon.com/images/W/MEDIAX_792452-T2/images/I/61+wGrF3doS._AC_UF1000,1000_QL80_.jpg)
Defects Spectroscopy in Silicon Diodes: Deep-level traps in semiconductors physics: from ultra-fast recovery to radiation-induced damage: Barbero, Nicolò: 9783639773040: Amazon.com: Books
![Trap‐Limited Exciton Diffusion in Organic Semiconductors - Mikhnenko - 2014 - Advanced Materials - Wiley Online Library Trap‐Limited Exciton Diffusion in Organic Semiconductors - Mikhnenko - 2014 - Advanced Materials - Wiley Online Library](https://onlinelibrary.wiley.com/cms/asset/5681befa-f99b-4cae-a7ae-34bb06d437e0/adma201304162-gra-0001-m.jpg)
Trap‐Limited Exciton Diffusion in Organic Semiconductors - Mikhnenko - 2014 - Advanced Materials - Wiley Online Library
![Analysis on Trap States in p-Metal-Oxide-Semiconductor Capacitors with Ultraviolet/Ozone-Treated GaN Interfaces Through Frequency-Dispersion Capacitance–Voltage Measurements | Electronic Materials Letters Analysis on Trap States in p-Metal-Oxide-Semiconductor Capacitors with Ultraviolet/Ozone-Treated GaN Interfaces Through Frequency-Dispersion Capacitance–Voltage Measurements | Electronic Materials Letters](https://media.springernature.com/m685/springer-static/image/art%3A10.1007%2Fs13391-019-00194-z/MediaObjects/13391_2019_194_Figa_HTML.png)
Analysis on Trap States in p-Metal-Oxide-Semiconductor Capacitors with Ultraviolet/Ozone-Treated GaN Interfaces Through Frequency-Dispersion Capacitance–Voltage Measurements | Electronic Materials Letters
![Charge carrier traps in organic semiconductors: a review on the underlying physics and impact on electronic devices | Semantic Scholar Charge carrier traps in organic semiconductors: a review on the underlying physics and impact on electronic devices | Semantic Scholar](https://d3i71xaburhd42.cloudfront.net/69e1b8ccd98e21dce0611e2ebb6e7654c9051d72/3-Figure2-1.png)
Charge carrier traps in organic semiconductors: a review on the underlying physics and impact on electronic devices | Semantic Scholar
![Robust trap effect in transition metal dichalcogenides for advanced multifunctional devices | Nature Communications Robust trap effect in transition metal dichalcogenides for advanced multifunctional devices | Nature Communications](https://media.springernature.com/m685/springer-static/image/art%3A10.1038%2Fs41467-019-12200-x/MediaObjects/41467_2019_12200_Fig1_HTML.png)
Robust trap effect in transition metal dichalcogenides for advanced multifunctional devices | Nature Communications
![Energy band diagram for a semiconductor with deep-level traps. E C is... | Download Scientific Diagram Energy band diagram for a semiconductor with deep-level traps. E C is... | Download Scientific Diagram](https://www.researchgate.net/publication/258724308/figure/fig1/AS:615033964879874@1523646932143/Energy-band-diagram-for-a-semiconductor-with-deep-level-traps-E-C-is-lower-edge-of-the.png)
Energy band diagram for a semiconductor with deep-level traps. E C is... | Download Scientific Diagram
Carrier trapping process by trap states of a p-type semiconductor. At... | Download Scientific Diagram
Spectroscopy of Charge Carriers and Traps in Field-Doped Organic Semiconductors - UNT Digital Library
![Comparison of typical trap energies relative to the electronic band... | Download Scientific Diagram Comparison of typical trap energies relative to the electronic band... | Download Scientific Diagram](https://www.researchgate.net/publication/336333109/figure/fig1/AS:811741642506240@1570545697080/Comparison-of-typical-trap-energies-relative-to-the-electronic-band-structure-of-a.png)
Comparison of typical trap energies relative to the electronic band... | Download Scientific Diagram
Charge carrier traps in organic semiconductors: a review on the underlying physics and impact on electronic devices - Journal of Materials Chemistry C (RSC Publishing)
![Charge carrier traps in organic semiconductors: a review on the underlying physics and impact on electronic devices - Journal of Materials Chemistry C (RSC Publishing) DOI:10.1039/C9TC05695E Charge carrier traps in organic semiconductors: a review on the underlying physics and impact on electronic devices - Journal of Materials Chemistry C (RSC Publishing) DOI:10.1039/C9TC05695E](https://pubs.rsc.org/image/article/2020/TC/c9tc05695e/c9tc05695e-f3_hi-res.gif)
Charge carrier traps in organic semiconductors: a review on the underlying physics and impact on electronic devices - Journal of Materials Chemistry C (RSC Publishing) DOI:10.1039/C9TC05695E
![Impact of Bulk Trapping Phenomena on the Maximum Attainable Photovoltage of Semiconductor–Liquid Interfaces | The Journal of Physical Chemistry C Impact of Bulk Trapping Phenomena on the Maximum Attainable Photovoltage of Semiconductor–Liquid Interfaces | The Journal of Physical Chemistry C](https://pubs.acs.org/cms/10.1021/acs.jpcc.8b06854/asset/images/large/jp-2018-068549_0008.jpeg)
Impact of Bulk Trapping Phenomena on the Maximum Attainable Photovoltage of Semiconductor–Liquid Interfaces | The Journal of Physical Chemistry C
![Device performance and density of trap states of organic and inorganic field-effect transistors - ScienceDirect Device performance and density of trap states of organic and inorganic field-effect transistors - ScienceDirect](https://ars.els-cdn.com/content/image/1-s2.0-S1566119915301920-fx1.jpg)
Device performance and density of trap states of organic and inorganic field-effect transistors - ScienceDirect
![Sensors | Free Full-Text | Effects of Charge Traps on Hysteresis in Organic Field-Effect Transistors and Their Charge Trap Cause Analysis through Causal Inference Techniques Sensors | Free Full-Text | Effects of Charge Traps on Hysteresis in Organic Field-Effect Transistors and Their Charge Trap Cause Analysis through Causal Inference Techniques](https://www.mdpi.com/sensors/sensors-23-02265/article_deploy/html/images/sensors-23-02265-g005.png)